THBP209VIS-M - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Metric
THBP209VIS-M - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Metric
Wavelength Range 200 - 1100 nm
Detector Material UV-Enhanced Si
Aperture Diameter 9 mm
Scan Methods Scanning Slits, Knife Edge
Slit Sizes 5 µm and 25 µm
Beam Diameter Range 2.5 µm - 9 mm
Features
- Three Dual Scanning Slit Beam Profiler Models
- Item # THBP209VIS-M for 200 nm - 1100 nm
- Item # THBP209IR1-M for 500 nm - 1700 nm
- Item # THBP209IR2-M for 900 nm - 2700 nm
- High-Precision Analysis of Near-Gaussian Beam Quality
- Reconstructs 2D and Pseudo 3D Spatial Power Distribution
- Single Stand-Alone Measurement Head
- Characterizes Continuous Wave or ≥10 Hz Pulsed Laser Emission
- Scanning Speeds from 2 to 20 Hz
- User-Calibratable Power Readout (See Manual for User-Calibration Procedure)
- Dynamic Range of 78 dB
- Low-Noise Amplifier
- High-Speed USB 2.0 Interface to PC