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Measurement accuracy can be maximized for a given PDL measurement system by taking the following precautions. 1. Minimize the optical insertion loss variations of the polarization controller by using the Agilent 118966A  olarization Controller with Option 025 which provides fiber pigtail interfaces that can be cut and spliced to the test system and to the DUT for minimal reflections. 2. Maintain constant source output power for each wavelength being measured. 3. Use an optical source which approaches 100% degree of polarization (DOP). Unpolarized light will not be attenuated by the PDL of a test device; therefore, the lower the DOP

The Agilent 83438A #009/71452B/ 11896A setup as shown in Figure 13 characterizes components for dense wave length division multiplexing (DWDM) applications fast and accurately versus wavelength. Under remote control, it can measure insertion loss, crosstalk and PDL automatically. Other characteristics can be calculated too, such as the polarization dependence of the center wavelength or bandwidth of a filter. The Erbium ASE Source Agilent 83438A with option 009 provides polarized light in the range 1525 to 1565 nm. Its polarization state is automatically randomized using the Agilent 11896A Polarization Controller. If the Agilent 11896A runs fast and the Agilent 71452B Optical

The Agilent 71451B/11896A Swept-Wavelength PDL Test System provides a high-speed method for measuring PDL across a 1250 to 1600 nm wavelength range. Measurement data examples are shown in Figures 10 and 11. This measurement uses the Agilent 71451B Optical Spectrum Analyzer to monitor changes in DUT insertion loss versus wavelength. Automatically swept wavelength coverage is provided by the built-in, white-light source and monochromator of the Agilent 71451B Option 002 (see Figure 12). The test signal’s polarization state is automatically  adjusted using the Agilent 11896A Polarization Controller (included as part of the Agilent 71451B Option 003). PDL calculations are done automatically

The Agilent 8509/11896A Power Max./Min. PDL test system is a semi-automatic, single-wavelength PDL measurement  system. It provides a PDL value and absolute maximum and minimum power values and polarization information (see Figure 8). The Power Max./Min. PDL measurement method is similar to the Agilent 8153A/11896A power meter method discussed  in this document. During this measurement, the Agilent 8509A or 8509B Polarization Analyzer monitors the average output power and state of polarization. PDL Markers are automatically placed on the Poincare sphere (see Figure 8) to indicate the points at which optical power maximum and minimum occur. The respective Stokes parameters for

The Agilent 8153A/11896A power meter-based PDL test system provides high-accuracy, single-wavelength, PDL data. During this measurement, the Agilent 8153A Light wave Multimeter monitors output power variations and displays the PDL values (see Figures 5). The polarization state of the test signal is continually and automatically adjusted using the Agilent 11896A Polarization Controller shown in Figure 6. Measurement procedure This 11-step procedure enables single-wavelength PDL measurements to be performed on an Agilent 8153A/11896A power meter-based PDL measurement system. The Agilent 8153A Light wave Multimeter should be equipped with the MinMax automatic measurement feature before beginning this procedure. Contact an Agilent representative